Company News
7/17/2014
ZebraOptical Microscopic Topology Recovery

4/12/14
Sensitivity Test of the Zebraoptical Nanoradian NP-1 Probe

6/09/13
Sunrise Optical LLC: Zebraoptoprofiler Model X - nano-radian probe

5/22/12
Sunrise Optical LLC:  Zebraoptoprofiler Model X - the Long Optical Arm Commercial Scanner for
Large Radii X-ray Mirrors and Wafer Stress Tensor Measurements

3/29/12
SOI and small bow metrology

6/22/11
LED and Power Electronics Heat Sink Metrology  

6/21/11
Volume of Drops and Splatters - Forensic Measurements Using
Portable Zebraoptical Optoprofiler - Volume Metrology Application

5/16/11
Zebraoptical Integrated Metrology Tool - Low Coherence Fiber Optic Interferometer with Microscope
Attachment

5/4/11
Liquid Drops and Splatters Forensic Measurements Using Portable
Zebraoptical Optoprofiler

1/4/11
The Portable Zebraoptical OptoProfiler for topography of small and medium size objects.

4/4/10
Review paper on metrology techniques for thin wafers, MEMs membranes, and deep trenches
available at sales@zebraoptical.com

3/12/10
Zebraoptical OptoProfiler for QE Uniformity metrology for crystalline and thin film solar cells is
available. Sunrise Optical LLC is accepting pre-qualified samples for the tool evaluation.

1/21/10
New family of surface plate accessories for Zebraoptical OptoProfiler for bow, warp for large
crystalline solar cells, MEMs substrates and other devices.

1/04/10
Zebraoptical OptoProfiler for bow, warp, roller wave glass, edge kink metrology for tempered glass,
and thin film solar cells

12/16/09
ZebraOptical CT-IR an Interferometric Probe for Substrate Thickness, Topography, Trench Depth,
Membrane Thickness and other Applications from Sunrise Optical LLC

4/14/09
Sunrise Optical LLC, manufacturer of Zebra Optoprofiler, donated chess boards to Lauderdale
Lakes Middle School in Fort Lauderdale Florida.

7/31/08
New Zebra OptoProfiler Large Glass Option for Solar Glass Substrate Bow,
Warp, Roller Wave and Full Surface Topography

4/14/08
New Zebra OptoProfiler Tool for Patterned Solar Cell Bow, Warp, Full Surface Topography and Full
Stress Tensor Characterization from Sunrise
Optical LLC

Publications

"Efficient calibration algorithm, and calibration pattern for correcting distortions for
three-dimensional image acquisition systems for microscopic applications" Wojtek J. Walecki and
Fanny Szondy Proc. SPIE Vol. 6861, 68610S (Feb. 12, 2008)

"Fast in-line surface topography metrology enabling stress calculation for solar cell manufacturing
for throughput in excess of 2000 wafers per hour"   W J Walecki, F Szondy and M M Hilali 2008
Meas. Sci. Technol. 19 025302 (6pp) doi:10.1088/0957-0233/19/2/025302
ZebraOptical Optoprofiler
Press and Publications
Products